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De Santi, C., Nardo, A., Wong, M.H., Goto, K., Kuramata, A., Yamakoshi, S., Murakami, H., Kumagai, Y., Higashiwaki, M., Meneghesso, G., Zanoni, E., Meneghini, M. Stability and degradation of isolation and surface in Ga2O3 devices. Microelectronics Reliability (Microelectron. Rel.). 100-101: 113453 1-4, 2019
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