最新論文

Stability and degradation of isolation and surface in Ga2O3 devices

De Santi, C., Nardo, A., Wong, M.H., Goto, K., Kuramata, A., Yamakoshi, S., Murakami, H., Kumagai, Y., Higashiwaki, M., Meneghesso, G., Zanoni, E., Meneghini, M. Stability and degradation of isolation and surface in Ga2O3 devices. Microelectronics Reliability (Microelectron. Rel.). 100-101: 113453 1-4, 2019